Semantic Technology Conference | May 20-24, 2007
 

     

Semantic Technologies for Manufacturing and Systems Integration

Ray Piasecki
Chief Scientist
BAE Systems

Steven Ray
Division Chief
NIST


 

Tuesday, 5/22/2007
11:45 AM - 12:45 PM
Level: Business/Technical - Introductory

This session looks at applying semantic technologies to perform semantic systems integration and in integrated manufacturing systems.

How has BAE Systems been applying semantic technologies to perform semantic systems integration, knowledge representation and supporting apps that do link analysis and contextual data mining? Ray Piasecki discusses the application of semantic technologies to perform systems of systems integration and advance beyond the previous genre of metadata-centric systems to an information level paradigm.

At NIST, work is taking place to develop formal ontologies using emerging semantic methods such as Process Specification Language (PSL), Web Ontology Language (OWL) and Resource Description Framework (RDF), in support of manufacturing integration. Their research and development activities include: Next Generation Integration Technologies NIST is leveraging its work begun in the Automated Methods for Integrating Systems (AMIS) project developing tools, methods, and models, and using the ontologies developed for the integration scenarios, to support the systematization and automation of various aspects of the integration process.

NIST is developing formal ontologies using emerging semantic methods such as Process Specification Language (PSL), Web Ontology Language (OWL) and Resource Description Framework (RDF), in support of the integration scenarios. The Process Specification Language (PSL) defines a neutral representation for manufacturing processes. Process data is used throughout the life cycle of a product, from early indications of manufacturing process flagged during design, through process planning, validation, production scheduling, and control. In addition, the notion of process also underlies the entire manufacturing cycle, coordinating the workflow within engineering and shop floor manufacturing.


Ray Piasecki is a Chief Scientist and Engineering Fellow at BAE Systems. He has been researching information discovery and analysis systems for more the 25 years. For the last ten years, Ray has been applying various semantic technologies with the goal of creating information level constructs for the enterprise in support of contextual data mining, data fusion and link analysis applications.

Steven R. Ray is Chief, Manufacturing Systems Integration Division at the National Institute of Standards and Technology. He is responsible for the management of a division of roughly 60 staff and visiting researchers dedicated to the solution of national problems related to measurements and standards supporting systems interoperation in the manufacturing sector. Dr. Ray has twice been awarded the Department of Commerce Bronze Medal. He received his Ph.D. in Mechanical and Aerospace Engineering in 1981 from Princeton University, and his Bachelor's degree in Physics from the University of Bristol, England.

   
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